Library of American University of Madaba

Normal View MARC View ISBD View

Epstein, Benjamin, 1918-

Mathematical models for systems reliability / Benjamin Epstein, Ishay Weissman. - Boca Raton, FL : CRC Press, 2008. - 253 p. : ill. ; 25 cm.

"A Chapman & Hall book."

Includes bibliographical references (p. 247-250) and index.

ISBN: 9781420080827 (alk. paper) 1420080822 (alk. paper)

Subjects--Topical Terms:
Reliability (Engineering)--Mathematics.
System failures (Engineering)--Mathematical models.

LC Class. No.: TA169 / .E67 2008

Dewey Class. No.: 620.00452015118 / E67