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Strain Effect in Semiconductors (Record no. 10111)

000 -LEADER
fixed length control field 02951nam a22004575i 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140310143331.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100301s2010 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781441905529
978-1-4419-0552-9
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.381
Edition number 23
264 #1 -
-- Boston, MA :
-- Springer US,
-- 2010.
912 ## -
-- ZDB-2-ENG
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Sun, Yongke.
Relator term author.
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE
Title Strain Effect in Semiconductors
Medium [electronic resource] :
Remainder of title Theory and Device Applications /
Statement of responsibility, etc by Yongke Sun, Scott E. Thompson, Toshikazu Nishida.
250 ## - EDITION STATEMENT
Edition statement First.
300 ## - PHYSICAL DESCRIPTION
Other physical details online resource.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Overview: The Age of Strained Devices -- Band Structures of Strained Semiconductors -- Stress, Strain, Piezoresistivity, and Piezoelectricity -- Strain and Semiconductor Crystal Symmetry -- Band Structures of Strained Semiconductors -- Low-Dimensional Semiconductor Structures -- Transport Theory of Strained Semiconductors -- Semiconductor Transport -- Strain in Semiconductor Devices -- Strain in Electron Devices -- Piezoresistive Strain Sensors -- Strain Effects on Optoelectronic Devices.
520 ## - SUMMARY, ETC.
Summary, etc Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also: Treat strain physics at both the qualitative overview level as well as provide detailed fundamentals Explain strain physics relevant to logic devices as well as strain-based MEMS This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
Topical term or geographic name as entry element Electronics.
Topical term or geographic name as entry element Optical materials.
Topical term or geographic name as entry element Engineering.
Topical term or geographic name as entry element Electronics and Microelectronics, Instrumentation.
Topical term or geographic name as entry element Solid State Physics.
Topical term or geographic name as entry element Spectroscopy and Microscopy.
Topical term or geographic name as entry element Optical and Electronic Materials.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Thompson, Scott E.
Relator term author.
Personal name Nishida, Toshikazu.
Relator term author.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9781441905512
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-1-4419-0552-9
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Item type E-Book
Copies
Price effective from Permanent location Date last seen Not for loan Date acquired Source of classification or shelving scheme Koha item type Damaged status Lost status Withdrawn status Current location Full call number
2014-03-27AUM Main Library2014-03-27 2014-03-27 E-Book   AUM Main Library621.381

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