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Reliability of Microtechnology (Record no. 10170)

000 -LEADER
fixed length control field 03147nam a22005055i 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140310143332.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 110204s2011 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781441957603
978-1-4419-5760-3
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.381
Edition number 23
264 #1 -
-- New York, NY :
-- Springer New York,
-- 2011.
912 ## -
-- ZDB-2-ENG
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Liu, Johan.
Relator term author.
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE
Title Reliability of Microtechnology
Medium [electronic resource] :
Remainder of title Interconnects, Devices and Systems /
Statement of responsibility, etc by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson.
250 ## - EDITION STATEMENT
Edition statement 1.
300 ## - PHYSICAL DESCRIPTION
Extent XIII, 204p. 50 illus.
Other physical details online resource.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Introduction to Reliability and its Importance -- Reliability Metrology -- General Failure Mechanisms of Microsystems -- Solder and Conductive Adhesive Joint Reliability -- Accelerated Testing -- Reliability Design for Manufacturability -- Component Reliability -- System Level Reliability -- Reliability and Quality Management of Microsystem -- Experimental Tools for Reliability Analysis.
520 ## - SUMMARY, ETC.
Summary, etc Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail. The book also: Discusses the general failure mechanisms of microsystems on a component level Offers comprehensive coverage of solder joint reliability at the microsystems level Analyzes�quality issues and manufacturing at the microsystems level Reliability of Microtechnology is an ideal volume for researchers and professional engineers working in reliability and manufacturing. The book also includes exercises and detailed solutions at the end of each chapter.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
Topical term or geographic name as entry element System safety.
Topical term or geographic name as entry element Electronics.
Topical term or geographic name as entry element Optical materials.
Topical term or geographic name as entry element Engineering.
Topical term or geographic name as entry element Electronics and Microelectronics, Instrumentation.
Topical term or geographic name as entry element Optical and Electronic Materials.
Topical term or geographic name as entry element Quality Control, Reliability, Safety and Risk.
Topical term or geographic name as entry element Nanotechnology and Microengineering.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Salmela, Olli.
Relator term author.
Personal name Sarkka, Jussi.
Relator term author.
Personal name Morris, James E.
Relator term author.
Personal name Tegehall, Per-Erik.
Relator term author.
Personal name Andersson, Cristina.
Relator term author.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9781441957597
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-1-4419-5760-3
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Item type E-Book
Copies
Price effective from Permanent location Date last seen Not for loan Date acquired Source of classification or shelving scheme Koha item type Damaged status Lost status Withdrawn status Current location Full call number
2014-03-27AUM Main Library2014-03-27 2014-03-27 E-Book   AUM Main Library621.381

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