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| 005 - DATE AND TIME OF LATEST TRANSACTION |
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20140310143332.0 |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
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100805s2010 xxu| s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9781441963482 |
|
978-1-4419-6348-2 |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
658.56 |
| Edition number |
23 |
| 264 #1 - |
|---|
| -- |
Boston, MA : |
| -- |
Springer US : |
| -- |
Imprint: Springer, |
| -- |
2010. |
| 912 ## - |
|---|
| -- |
ZDB-2-ENG |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
McPherson, J.W. |
| Relator term |
author. |
| 245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE |
|---|
| Title |
Reliability Physics and Engineering |
| Medium |
[electronic resource] : |
| Remainder of title |
Time-To-Failure Modeling / |
| Statement of responsibility, etc |
by J.W. McPherson. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
XIII, 318 p. |
| Other physical details |
online resource. |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Materials and Device Degradation -- From Material/Device Degradation to Time-To-Failure -- Time-To-Failure Modeling -- Gaussian Statistics — An Overview -- Time-To-Failure Statistics -- Failure Rate Modeling -- Accelerated Degradation -- Acceleration Factor Modeling -- Ramp-to-Failure Testing -- Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits -- Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering -- Conversion of Dynamical Stresses into Effective Static Values -- Increasing the Reliability of Device/Product Designs -- Erratum to: Materials and Device Degradation. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc |
Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products. Key features include: • Materials/Device Degradation • Degradation Kinetics • Time-To-Failure Modeling • Statistical Tools • Failure-Rate Modeling • Accelerated Testing • Ramp-To-Failure Testing • Important Failure Mechanisms for Integrated Circuits • Important Failure Mechanisms for Mechanical Components • Conversion of Dynamical Stresses into Static Equivalents • Small Design Changes Producing Major Reliability Improvements This textbook includes numerous example problems with solutions. Also, exercise problems along with answers are included at the end of each chapter. Reliability Physics and Engineering can be a useful resource for students, engineers and materials scientists. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Engineering. |
|
|---|
| Topical term or geographic name as entry element |
Mechanical engineering. |
|
|---|
| Topical term or geographic name as entry element |
System safety. |
|
|---|
| Topical term or geographic name as entry element |
Electronics. |
|
|---|
| Topical term or geographic name as entry element |
Engineering. |
|
|---|
| Topical term or geographic name as entry element |
Quality Control, Reliability, Safety and Risk. |
|
|---|
| Topical term or geographic name as entry element |
Electronics and Microelectronics, Instrumentation. |
|
|---|
| Topical term or geographic name as entry element |
Mechanical Engineering. |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
|---|
| Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY |
|---|
| Title |
Springer eBooks |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Display text |
Printed edition: |
| International Standard Book Number |
9781441963475 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
http://dx.doi.org/10.1007/978-1-4419-6348-2 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
|
| Item type |
E-Book |
