//]]>

Nanoscale Memory Repair (Record no. 10277)

000 -LEADER
fixed length control field 03471nam a22004215i 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140310143333.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 110110s2011 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781441979582
978-1-4419-7958-2
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition number 23
264 #1 -
-- New York, NY :
-- Springer New York :
-- Imprint: Springer,
-- 2011.
912 ## -
-- ZDB-2-ENG
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Horiguchi, Masashi.
Relator term author.
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE
Title Nanoscale Memory Repair
Medium [electronic resource] /
Statement of responsibility, etc by Masashi Horiguchi, Kiyoo Itoh.
300 ## - PHYSICAL DESCRIPTION
Extent X, 218 p.
Other physical details online resource.
440 1# - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Integrated Circuits and Systems,
International Standard Serial Number 1558-9412
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note An Introduction to Repair Techniques: Basics of Redundancy -- Basics of Error Checking and Correction -- Comparison between Redundancy and ECC -- Repairs of Logic Circuits -- Redundancy: Models of Fault Distribution -- Yield Improvement through Redundancy -- Replacement Schemes -- Intra-Subarray Replacement -- Inter-Subarray Replacement -- Subarray Replacement -- Devices for Storing Addresses -- Testing for Redundancy -- Error Checking and Correction: Linear Algebra and Linear Codes -- Galois Field -- Error-Correcting Codes -- Coding and Decoding Circuits -- Theoretical Reduction in Soft-Error and Hard-Error Rates -- Application of ECC -- Testing for ECC -- Synergistic Effect of Redundancy and ECC: Repair of Bit Faults using Synergistic Effect -- Application of Synergistic Effect.
520 ## - SUMMARY, ETC.
Summary, etc Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. As a result, repair techniques have been indispensable for nano-scale memories. Without these techniques, even modern MPUs/ SoCs, in which memories have dominated the area and performance, could not have been designed successfully. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.  Presents the first comprehensive reference to reliability and repair techniques for nano-scale memories; Covers both the mathematical foundations and engineering applications of yield and reliability in nano-scale memories; Includes a variety of practical circuits and logic, critical for higher yield and reliability, which have been proven successful during the authors’ extensive experience in developing memories and low-voltage CMOS circuits.    
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
Topical term or geographic name as entry element Computer aided design.
Topical term or geographic name as entry element Systems engineering.
Topical term or geographic name as entry element Engineering.
Topical term or geographic name as entry element Circuits and Systems.
Topical term or geographic name as entry element Computer-Aided Engineering (CAD, CAE) and Design.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Itoh, Kiyoo.
Relator term author.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9781441979575
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-1-4419-7958-2
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Item type E-Book
Copies
Price effective from Permanent location Date last seen Not for loan Date acquired Source of classification or shelving scheme Koha item type Damaged status Lost status Withdrawn status Current location Full call number
2014-03-28AUM Main Library2014-03-28 2014-03-28 E-Book   AUM Main Library621.3815