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20140310143333.0 |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
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110907s2012 xxu| s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9781441982971 |
|
978-1-4419-8297-1 |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.3815 |
| Edition number |
23 |
| 264 #1 - |
|---|
| -- |
New York, NY : |
| -- |
Springer New York, |
| -- |
2012. |
| 912 ## - |
|---|
| -- |
ZDB-2-ENG |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Tehranipoor, Mohammad. |
| Relator term |
author. |
| 245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE |
|---|
| Title |
Test and Diagnosis for Small-Delay Defects |
| Medium |
[electronic resource] / |
| Statement of responsibility, etc |
by Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
XVI, 212p. 114 illus. |
| Other physical details |
online resource. |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Introduction to VLSI Testing -- Delay Test and System-Delay Defects -- Long Path-Based Hybrid Method -- Process Variations- and Crosstalk-Aware Pattern Selection -- Power Supply Noise- and Crosstalk-Aware Hybrid Method -- SDD-Based Hybrid Method -- Maximizing Crosstalk Effect on Critical Paths -- Maximizing Power Supply Noise on Critical Paths -- Faster-than-at-speed Test -- Introduction to Diagnosis -- Diagnosing Noise-Induced SDDs by Using Dynamic SDF. . |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc |
This book introduces new techniques for detecting and diagnosing small-delay defects (SDD) in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise. This book presents new techniques and methodologies to improve overall SDD detection with very small pattern sets. These methods can result in pattern counts as low as a traditional 1-detect pattern set and long path sensitization and SDD detection similar to or even better than n-detect or timing-aware pattern sets. The important design parameters and pattern-induced noises such as process variations,power supply noise (PSN) and crosstalk are taken into account in the methodologies presented. A diagnostic flow is also presented to identify whether the failure is caused by PSN, crosstalk, or a combination of these two effects. * Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects; * Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and noise-aware methodologies; * Shows readers to use timing information for small-delay defect diagnosis, in order to increase the resolution of their current diagnosis flow. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Engineering. |
|
|---|
| Topical term or geographic name as entry element |
Operating systems (Computers). |
|
|---|
| Topical term or geographic name as entry element |
Systems engineering. |
|
|---|
| Topical term or geographic name as entry element |
Engineering. |
|
|---|
| Topical term or geographic name as entry element |
Circuits and Systems. |
|
|---|
| Topical term or geographic name as entry element |
Performance and Reliability. |
|
|---|
| Topical term or geographic name as entry element |
Nanotechnology and Microengineering. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Peng, Ke. |
| Relator term |
author. |
|
|---|
| Personal name |
Chakrabarty, Krishnendu. |
| Relator term |
author. |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
|---|
| Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY |
|---|
| Title |
Springer eBooks |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Display text |
Printed edition: |
| International Standard Book Number |
9781441982964 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
http://dx.doi.org/10.1007/978-1-4419-8297-1 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
|
| Item type |
E-Book |
