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20140310143334.0 |
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020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9781441999887 |
|
978-1-4419-9988-7 |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.381 |
Edition number |
23 |
264 #1 - |
-- |
New York, NY : |
-- |
Springer New York : |
-- |
Imprint: Springer, |
-- |
2012. |
912 ## - |
-- |
ZDB-2-ENG |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Boyd, Sarah B. |
Relator term |
author. |
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE |
Title |
Life-Cycle Assessment of Semiconductors |
Medium |
[electronic resource] / |
Statement of responsibility, etc |
by Sarah B. Boyd. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
XXVII, 226p. 50 illus. |
Other physical details |
online resource. |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
1 Introduction -- 2 Semiconductor LCI Methods -- 3 Semiconductor Manufacturing Trends in Product Type and Geography -- 4 Life-cycle Energy and Global Warming Emissions of CMOS Logic -- 5 Life-cycle Assessment of CMOS Logic -- 6 Life-cycle Assessment of Flash Memory -- 7 Life-cycle Assessment of Dynamic Random Access Memory -- 8 Semiconductor LCA: The Road Ahead. |
520 ## - SUMMARY, ETC. |
Summary, etc |
Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information technologies (IT). The analysis and results presented in this book will allow a higher degree of confidence and certainty in decisions concerning the use of IT in efforts to reduce climate change and other environmental effects. Coverage includes but is not limited to semiconductor manufacturing trends by product type and geography, unique coverage of life-cycle assessment, with a focus on uncertainty and sensitivity analysis of energy and global warming missions for CMOS logic devices, life cycle assessment of flash memory and life cycle assessment of DRAM. The information and conclusions discussed here will be highly relevant and useful to individuals and institutions. The book also: Provides a detailed, complete and transparent life cycle assessment of semiconductor logic and memory devices Offers thorough evaluations of many technology generations of semiconductor logic and memory Contains an overview of environmentally significant trends in the semiconductor industry Life-Cycle Assessment of Semiconductors is an ideal book for researchers and engineers interested in the environmental impact of semiconductor manufacturing. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Engineering. |
|
Topical term or geographic name as entry element |
Electronics. |
|
Topical term or geographic name as entry element |
Renewable energy sources. |
|
Topical term or geographic name as entry element |
Engineering. |
|
Topical term or geographic name as entry element |
Electronics and Microelectronics, Instrumentation. |
|
Topical term or geographic name as entry element |
Semiconductors. |
|
Topical term or geographic name as entry element |
Renewable and Green Energy. |
710 2# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY |
Title |
Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Display text |
Printed edition: |
International Standard Book Number |
9781441999870 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
http://dx.doi.org/10.1007/978-1-4419-9988-7 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
|
Item type |
E-Book |