000 -LEADER |
fixed length control field |
02688nam a22004575i 4500 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
OSt |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20140310143336.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
fixed length control field |
cr nn 008mamaa |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
110705s2011 xxu| s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9781461404453 |
|
978-1-4614-0445-3 |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.3815 |
Edition number |
23 |
264 #1 - |
-- |
Boston, MA : |
-- |
Springer US, |
-- |
2011. |
912 ## - |
-- |
ZDB-2-ENG |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Cao, Yu. |
Relator term |
author. |
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE |
Title |
Predictive Technology Model for Robust Nanoelectronic Design |
Medium |
[electronic resource] / |
Statement of responsibility, etc |
by Yu Cao. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
XV, 173 p. |
Other physical details |
online resource. |
440 1# - SERIES STATEMENT/ADDED ENTRY--TITLE |
Title |
Integrated Circuits and Systems, |
International Standard Serial Number |
1558-9412 |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
1. Introduction -- 2. Predictive Technology Model of Conventional CMOS Devices -- 3. Predictive Technology Model of Enhanced CMOS Devices -- 4. Statistical Extraction and Modeling of CMOS Variability -- 5. Modeling of Temporal Reliability Degradation -- 6. Modeling of Interconnect Parasitics -- 7. Design Benchmark with Predictive Technology Model -- 8. Predictive Process Design Kits -- 9. Predictive Modeling of Carbon Nanotube Devices -- 10. Predictive Technology Model for Future Nanoelectronic Design. |
520 ## - SUMMARY, ETC. |
Summary, etc |
Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Engineering. |
|
Topical term or geographic name as entry element |
Operating systems (Computers). |
|
Topical term or geographic name as entry element |
Electronics. |
|
Topical term or geographic name as entry element |
Systems engineering. |
|
Topical term or geographic name as entry element |
Nanotechnology. |
|
Topical term or geographic name as entry element |
Engineering. |
|
Topical term or geographic name as entry element |
Circuits and Systems. |
|
Topical term or geographic name as entry element |
Electronics and Microelectronics, Instrumentation. |
|
Topical term or geographic name as entry element |
Nanotechnology. |
|
Topical term or geographic name as entry element |
Performance and Reliability. |
710 2# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY |
Title |
Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Display text |
Printed edition: |
International Standard Book Number |
9781461404446 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
http://dx.doi.org/10.1007/978-1-4614-0445-3 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
|
Item type |
E-Book |