000 -LEADER |
fixed length control field |
02624nam a22004695i 4500 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
OSt |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20140310143342.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
fixed length control field |
cr nn 008mamaa |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
100907s2010 gw | s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9783642024177 |
|
978-3-642-02417-7 |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.36 |
Edition number |
23 |
264 #1 - |
-- |
Berlin, Heidelberg : |
-- |
Springer Berlin Heidelberg, |
-- |
2010. |
912 ## - |
-- |
ZDB-2-ENG |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Breitenstein, Otwin. |
Relator term |
author. |
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE |
Title |
Lock-in Thermography |
Medium |
[electronic resource] : |
Remainder of title |
Basics and Use for Evaluating Electronic Devices and Materials / |
Statement of responsibility, etc |
by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
X, 258 p. |
Other physical details |
online resource. |
440 1# - SERIES STATEMENT/ADDED ENTRY--TITLE |
Title |
Springer Series in Advanced Microelectronics, |
International Standard Serial Number |
1437-0387 ; |
Volume number/sequential designation |
10 |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook. |
520 ## - SUMMARY, ETC. |
Summary, etc |
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Physics. |
|
Topical term or geographic name as entry element |
Engineering. |
|
Topical term or geographic name as entry element |
Materials. |
|
Topical term or geographic name as entry element |
Surfaces (Physics). |
|
Topical term or geographic name as entry element |
Physics. |
|
Topical term or geographic name as entry element |
Optics, Optoelectronics, Plasmonics and Optical Devices. |
|
Topical term or geographic name as entry element |
Characterization and Evaluation of Materials. |
|
Topical term or geographic name as entry element |
Engineering, general. |
|
Topical term or geographic name as entry element |
Structural Materials. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Warta, Wilhelm. |
Relator term |
author. |
|
Personal name |
Langenkamp, Martin. |
Relator term |
author. |
710 2# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY |
Title |
Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Display text |
Printed edition: |
International Standard Book Number |
9783642024160 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
http://dx.doi.org/10.1007/978-3-642-02417-7 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
|
Item type |
E-Book |