000 -LEADER |
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04576nam a22003975i 4500 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
OSt |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20140310143347.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
fixed length control field |
cr nn 008mamaa |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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110505s2011 gw | s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9783642204265 |
|
978-3-642-20426-5 |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
620.1064 |
Edition number |
23 |
264 #1 - |
-- |
Berlin, Heidelberg : |
-- |
Springer Berlin Heidelberg, |
-- |
2011. |
912 ## - |
-- |
ZDB-2-ENG |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Kihm, Kenneth D. |
Relator term |
author. |
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE |
Title |
Near-Field Characterization of Micro/Nano-Scaled Fluid Flows |
Medium |
[electronic resource] / |
Statement of responsibility, etc |
by Kenneth D. Kihm. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
VIII, 156 p. |
Other physical details |
online resource. |
440 1# - SERIES STATEMENT/ADDED ENTRY--TITLE |
Title |
Experimental Fluid Mechanics ; |
Volume number/sequential designation |
0 |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Introduction -- Definitions of near-field -- Evanescent wave penetration depth -- Surface -- Photon penetration skin-depth into metal -- Penetration depth of no-slip boundary conditions -- Equilibrium height (hm) for small particles under near-field forces -- Total Internal Reflection Microscopy (TIRM) -- Ratiometric TIRM imaging analysis -- Near-field applications of TIRM -- Near-wall hindered Brownian motion of nanoparticles -- Slip-flows in the near-field -- Cytoplasmic viscosity and intracellular vesicle sizes -- Optical Serial Sectioning Microscopy (OSSM) -- Point spread functions (PSFs) under aberration-free design conditions -- Point spread functions (PSFs) under off-design conditions -- Principles of OSSM -- Near-field applications of OSSM -- Three-dimensional particle tracking velocimetry (PTV) -- Near-wall thermometry -- Near-field mixture concentration measurements -- Confocal Laser Scanning Microscopy (CLSM) -- Principles of confocal imaging -- Microscopic imaging resolutions -- Confocal microscopic imaging resolutions -- Optical slicing thickness of confocal microscopy -- Confocal laser scanning microscopic particle imaging velocimetry (CLSM-PIV) system -- Near-field applications of CLSM-PIV -- Poiseuille flows in a microtube -- Microscale rotating Couette flows -- Moving bubbles in a microchannel -- Surface Plasmon Resonance Microscopy (SPRM) -- Surface plasmon polaritons (SPPs) -- Dispersion of SPP -- Kretschmann’s three-layer configuration -- Surface plasmon resonance (SPR) reflectance -- Surface plasmon resonance microscopy (SPRM) imaging systems -- Selection of a prism for SPRM -- SPR reflectance imaging resolution -- Near-field applications of SPRM -- History and uses of SPRM -- Label-free mapping of microfluidic mixing fields -- Near-field mapping of salinity diffusion -- Dynamic monitoring of nanoparticle concentration profiles -- Unveiling the fingerprints of nanocrystalline self-assembly -- Near-wall thermometry -- Reflection Interference Contrast Microscopy (RICM) -- Interference of plane waves -- Principles and practical issues of RICM -- Near-field applications of RICM -- Thin-film thickness measurements -- Electrohydrodynamic (EHD) control of thin liquid film -- Dynamic fingerprinting of live-cell focal contacts -- References. |
520 ## - SUMMARY, ETC. |
Summary, etc |
The near-field – the region within 100 nm from a solid interface - is an exciting arena in which several important multi-scale transport phenomena are physically characterized, such as flow mixing and drag, heat and mass transfer, near-wall behavior of nanoparticles, the binding of bio-molecules, crystallization, and surface deposition processes, just to name a few. This book presents a number of microscopicimaging techniques that were implemented and tested for near-field fluidic characterizations. These methods include Total Internal Reflection Microscopy (TIRM), Optical Serial Sectioning Microscopy (OSSM), Confocal Laser Scanning Microscopy (CLSM), Surface Plasmon Resonance Microscopy (SPRM), and Reflection Interference Contrast Microscopy (RICM). The basic principles, specifics of implementation, and example applications of each method are presented in order to promote the reader’s understanding of the techniques, so that these may be applied to their own research interests. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Engineering. |
|
Topical term or geographic name as entry element |
Hydraulic engineering. |
|
Topical term or geographic name as entry element |
Engineering. |
|
Topical term or geographic name as entry element |
Engineering Fluid Dynamics. |
|
Topical term or geographic name as entry element |
Fluid- and Aerodynamics. |
710 2# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY |
Title |
Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Display text |
Printed edition: |
International Standard Book Number |
9783642204258 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
http://dx.doi.org/10.1007/978-3-642-20426-5 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
|
Item type |
E-Book |