| 000 -LEADER |
|---|
| fixed length control field |
04314nam a22004335i 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20140310143354.0 |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
|---|
| fixed length control field |
cr nn 008mamaa |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
130321s2013 gw | s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783642339561 |
|
978-3-642-33956-1 |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
620.5 |
| Edition number |
23 |
| 264 #1 - |
|---|
| -- |
Berlin, Heidelberg : |
| -- |
Springer Berlin Heidelberg : |
| -- |
Imprint: Springer, |
| -- |
2013. |
| 912 ## - |
|---|
| -- |
ZDB-2-ENG |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Losurdo, Maria. |
| Relator term |
editor. |
| 245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE |
|---|
| Title |
Ellipsometry at the Nanoscale |
| Medium |
[electronic resource] / |
| Statement of responsibility, etc |
edited by Maria Losurdo, Kurt Hingerl. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
XXIV, 730 p. 423 illus., 106 illus. in color. |
| Other physical details |
online resource. |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Preamble -- Preface -- A Brief History and State of the Art of Ellipsometry.-Advanced Mueller Ellipsometry Instrumentation and Data Analysis -- Data Analysis for Nanomaterials: Effective Medium Approximation, its Limits and Implementations -- Relationship between Surface Morphology and Effective Medium Roughness -- Plasmonics and Effective-Medium Theory -- Thin films of Nanostructured Plasmonic Noble Metals.- Spectroscopic Ellipsometry on Metallic Gratings -- Mueller matrix applied to nanostructures -- Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles -- Generalized Ellipsometry Characterization of Sculptured Thin Films made by Glancing Angle Deposition -- THz Generalized Ellipsometry characterization of highly-ordered 3-dimensional Nanostructures -- Infrared ellipsometric investigations of free carriers and lattice vibrations in superconducting cuprates -- Real-time Ellipsometry for Probing charge-transfer processes at the nanoscale -- Polarimetric and other Optical Probes for the Solid - Liquid Interface -- Spectroscopic Ellipsometry for functional nano-layers of flexible organic electronic devices -- Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications -- Ellipsometry of semiconductor nanocrystals -- Spectroscopic Ellipsometry for Inline Process Control in the Semiconductor Industry -- Thin film applications in research and industry characterized by spectroscopic ellipsometry -- Ellipsometry and Correlation Measurements -- Nanotechnology: Applications and markets, present and future. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc |
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Engineering. |
|
|---|
| Topical term or geographic name as entry element |
Nanotechnology. |
|
|---|
| Topical term or geographic name as entry element |
Surfaces (Physics). |
|
|---|
| Topical term or geographic name as entry element |
Engineering. |
|
|---|
| Topical term or geographic name as entry element |
Nanotechnology and Microengineering. |
|
|---|
| Topical term or geographic name as entry element |
Measurement Science and Instrumentation. |
|
|---|
| Topical term or geographic name as entry element |
Characterization and Evaluation of Materials. |
|
|---|
| Topical term or geographic name as entry element |
Nanotechnology. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Hingerl, Kurt. |
| Relator term |
editor. |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
|---|
| Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY |
|---|
| Title |
Springer eBooks |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Display text |
Printed edition: |
| International Standard Book Number |
9783642339554 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
http://dx.doi.org/10.1007/978-3-642-33956-1 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
|
| Item type |
E-Book |
