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Emerging Technologies and Circuits (Record no. 12497)

000 -LEADER
fixed length control field 04074nam a22004575i 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140310143358.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 140220s2010 ne | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789048193790
978-90-481-9379-0
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition number 23
264 #1 -
-- Dordrecht :
-- Springer Netherlands :
-- Imprint: Springer,
-- 2010.
912 ## -
-- ZDB-2-ENG
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Amara, Amara.
Relator term editor.
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE
Title Emerging Technologies and Circuits
Medium [electronic resource] /
Statement of responsibility, etc edited by Amara Amara, Thomas Ea, Marc Belleville.
300 ## - PHYSICAL DESCRIPTION
Extent X, 266 p.
Other physical details online resource.
440 1# - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Lecture Notes in Electrical Engineering,
International Standard Serial Number 1876-1100 ;
Volume number/sequential designation 66
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Synergy Between Design and Technology: A Key Factor in the Evolving Microelectronic Landscape -- EMERGING TECHNOLOGY AND DEVICES -- New State Variable Opportunities Beyond CMOS: A System Perspective -- A Simple Compact Model to Analyze the Impact of Ballistic and Quasi-Ballistic Transport on Ring Oscillator Performance -- ADVANCED DEVICES AND CIRUITS -- Low-Voltage Scaled 6T FinFET SRAM Cells -- Independent-Double-Gate FINFET SRAM Cell for Drastic Leakage Current Reduction -- Metal Gate Effects on a 32 nm Metal Gate Resistor -- RELIABILITY AND SEU -- Threshold Voltage Shift Instability Induced by Plasma Charging Damage in MOSFETS with High-K Dielectric -- Analysis of SI Substrate Damage Induced by Inductively Coupled Plasma Reactor with Various Superposed Bias Frequencies -- POWER, TIMING AND VARIABILITY -- CMOS SOI Technology for WPAN: Application to 60 GHZ LNA -- SRAM Memory Cell Leakage Reduction Design Techniques in 65 nm Low Power PD-SOI CMOS -- Resilient Circuits for Dynamic Variation Tolerance -- Process Variability-Induced Timing Failures – A Challenge in Nanometer CMOS Low-Power Design -- How Does Inverse Temperature Dependence Affect Timing Sign-Off -- CMOS Logic Gates Leakage Modeling Under Statistical Process Variations -- On-Chip Circuit Technique for Measuring Jitter and Skew with Picosecond Resolution -- ANALOG AND MIXED SIGNAL -- DC–DC Converter Technologies for On-Chip Distributed Power Supply Systems – 3D Stacking and Hybrid Operation -- Sampled Analog Signal Processing: From Software-Defined to Software Radio.
520 ## - SUMMARY, ETC.
Summary, etc With the semiconductor market growth, new Integrated Circuit designs are pushing the limit of the technology and in some cases, require specific fine-tuning of certain process modules in manufacturing. Thus the communities of design and technology are increasingly intertwined. The issues that require close interactions and collaboration for trade-off and optimization across the design/device/process fields are addressed in Emerging Technologies and Circuits. It contains a set of outstanding papers, keynote and tutorials presented during 3 days at the International Conference On Integrated Circuit Design and Technology (ICICDT) held in June 2008 in Minatec, Grenoble. The selected papers are spread over 5 chapters covering various aspects of emerging technologies and devices, advanced circuit design, reliability, variability issues and solutions, advanced memories and analog and mixed signals. All these papers are focusing on design and technology interactions and comply with the scope of the conference.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
Topical term or geographic name as entry element Memory management (Computer science).
Topical term or geographic name as entry element Systems engineering.
Topical term or geographic name as entry element Nanotechnology.
Topical term or geographic name as entry element Engineering.
Topical term or geographic name as entry element Circuits and Systems.
Topical term or geographic name as entry element Nanotechnology.
Topical term or geographic name as entry element Memory Structures.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Ea, Thomas.
Relator term editor.
Personal name Belleville, Marc.
Relator term editor.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9789048193783
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-90-481-9379-0
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Item type E-Book
Copies
Price effective from Permanent location Date last seen Not for loan Date acquired Source of classification or shelving scheme Koha item type Damaged status Lost status Withdrawn status Current location Full call number
2014-04-03AUM Main Library2014-04-03 2014-04-03 E-Book   AUM Main Library621.3815

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