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20140310143400.0 |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
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120427s2012 ne | s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9789400741478 |
|
978-94-007-4147-8 |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.36 |
| Edition number |
23 |
| 264 #1 - |
|---|
| -- |
Dordrecht : |
| -- |
Springer Netherlands, |
| -- |
2012. |
| 912 ## - |
|---|
| -- |
ZDB-2-ENG |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Doornbos, Richard. |
| Relator term |
editor. |
| 245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE |
|---|
| Title |
From scientific instrument to industrial machine |
| Medium |
[electronic resource] : |
| Remainder of title |
Coping with architectural stress in embedded systems / |
| Statement of responsibility, etc |
edited by Richard Doornbos, Sjir van Loo. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
XII, 112p. 55 illus. |
| Other physical details |
online resource. |
| 440 1# - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
SpringerBriefs in Electrical and Computer Engineering, |
| International Standard Serial Number |
2191-8112 |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Foreword -- Acknowledgements -- Part I Introduction -- 1. The Endeavor -- Part II Architecture -- 2. Systems Architecture -- 3. Feasibility prototyping -- 4. Software architecture -- Part III Automation and control functions -- 5. Applications in automated microscopy -- 6. Focusing control -- 7. Positioning control -- Part IV Conclusion -- 8. Final words -- Appendix. Condor Project Publications. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc |
Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In From scientific instrument to industrial machine, we look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company. Traditionally, transmission electron microscopes are manually operated scientific instruments, but they also have enormous potential for use in industrial applications. However, this new market has quite different characteristics. There are strong demands for cost-effective analysis, accurate and precise measurements, and ease-of-use. These demands can be translated into new system qualities, e.g. reliability, predictability and high throughput, as well as new functions, e.g. automation of electron microscopic analyses, automated focusing and positioning functions. From scientific instrument to industrial machine takes a pragmatic approach to the problem of architectural stress. In particular, it describes the outcomes of the Condor project, a joint endeavour by a consortium of industrial and academic partners. In this collaboration an integrated approach was essential to successfully combine various scientific results and show the first steps towards a new direction. System modelling and prototyping were the key techniques to develop better understanding and innovative solutions to the problems associated with architectural stress. From scientific instrument to industrial machine is targeted mainly at industrial practitioners, in particular system architects and engineers working on high tech systems. It can therefore be read without particular knowledge of electron microscope systems or microscopic applications. The book forms a bridge between academic and applied science, and high tech industrial practice. By showing the approaches and solutions developed for the electron microscope, it is hoped that system designers will gain some insights in how to deal with architectural stress in similar challenges in the high tech industry. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Physics. |
|
|---|
| Topical term or geographic name as entry element |
Software engineering. |
|
|---|
| Topical term or geographic name as entry element |
Computer system performance. |
|
|---|
| Topical term or geographic name as entry element |
Engineering mathematics. |
|
|---|
| Topical term or geographic name as entry element |
Physics. |
|
|---|
| Topical term or geographic name as entry element |
Spectroscopy and Microscopy. |
|
|---|
| Topical term or geographic name as entry element |
Appl.Mathematics/Computational Methods of Engineering. |
|
|---|
| Topical term or geographic name as entry element |
Special Purpose and Application-Based Systems. |
|
|---|
| Topical term or geographic name as entry element |
Mathematical Modeling and Industrial Mathematics. |
|
|---|
| Topical term or geographic name as entry element |
System Performance and Evaluation. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
van Loo, Sjir. |
| Relator term |
editor. |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
|---|
| Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY |
|---|
| Title |
Springer eBooks |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Display text |
Printed edition: |
| International Standard Book Number |
9789400741461 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
http://dx.doi.org/10.1007/978-94-007-4147-8 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
|
| Item type |
E-Book |
