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Electro-Optical Effects to Visualize Field and Current Distributions in Semiconductors (Record no. 26741)

000 -LEADER
fixed length control field 02660nam a22004455i 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140310153032.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100715s2010 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783642034404
978-3-642-03440-4
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC176-176.9
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 530.41
Edition number 23
264 #1 -
-- Berlin, Heidelberg :
-- Springer Berlin Heidelberg,
-- 2010.
912 ## -
-- ZDB-2-PHA
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Böer, Karl W.
Relator term author.
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE
Title Electro-Optical Effects to Visualize Field and Current Distributions in Semiconductors
Medium [electronic resource] /
Statement of responsibility, etc by Karl W. Böer.
300 ## - PHYSICAL DESCRIPTION
Extent VIII, 125 p.
Other physical details online resource.
440 1# - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Springer Series in Solid-State Sciences,
International Standard Serial Number 0171-1873 ;
Volume number/sequential designation 162
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note High-Field Domains -- Moving High-Field Domains -- Negative Differential Conductivity Caused by Mobility -- Negative Differential Conductivity in Other Materials -- Current Channels.
520 ## - SUMMARY, ETC.
Summary, etc The book describes the basic principles that relate to field and current inhomogeneities in semiconductors and their kinetics that occur in the regime of negative differential conductances of semiconductors. The book presents the related theory and experiment. It proceeds to give for the first time the experimental methods to observe directly these inhomogeneities within the semiconductor. It analyses in detail the different ranges in which such inhomogeneities occur, when they are stationary and when not and what technical and device application result. The accompanying film on the website demonstrates all related kinetic effects. Information on these effects was previously mostly available indirectly by interpretation of current-voltage characteristics, or by point contact probing along the surface, or by changes in the luminescence spectrum. The material is based on the original papers of the research team of the author, starting in the late 50’s and updated to incl. 2008.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Physics.
Topical term or geographic name as entry element Microwaves.
Topical term or geographic name as entry element Optical materials.
Topical term or geographic name as entry element Physics.
Topical term or geographic name as entry element Solid State Physics.
Topical term or geographic name as entry element Spectroscopy and Microscopy.
Topical term or geographic name as entry element Optical and Electronic Materials.
Topical term or geographic name as entry element Microwaves, RF and Optical Engineering.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9783642034398
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-3-642-03440-4
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Item type E-Book

No copies available.

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