| 000 -LEADER |
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| fixed length control field |
03875nam a22004935i 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20140310153325.0 |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
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| fixed length control field |
cr nn 008mamaa |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
100715s2010 xxu| s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9780387981826 |
|
978-0-387-98182-6 |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
|---|
| Classification number |
TA404.6 |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
620.11 |
| Edition number |
23 |
| 264 #1 - |
|---|
| -- |
New York, NY : |
| -- |
Springer New York : |
| -- |
Imprint: Springer, |
| -- |
2010. |
| 912 ## - |
|---|
| -- |
ZDB-2-CMS |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Ayache, Jeanne. |
| Relator term |
author. |
| 245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE |
|---|
| Title |
Sample Preparation Handbook for Transmission Electron Microscopy |
| Medium |
[electronic resource] : |
| Remainder of title |
Methodology / |
| Statement of responsibility, etc |
by Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
XXIII, 250 p. 114 illus. |
| Other physical details |
online resource. |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Methodology: General Introduction -- to Materials -- The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM) -- Materials Problems and Approaches for TEM and TEM/STEM Analyses -- Physical and Chemical Mechanisms of Preparation Techniques -- Artifacts in Transmission Electron Microscopy -- Selection of Preparation Techniques Based on Material Problems and TEM Analyses -- Comparisons of Techniques -- Conclusion: What Is a Good Sample?. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc |
This two-volume Handbook is a comprehensive and authoritative guide to sample preparation for the transmission electron microscope. This first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology. Key Features of the Handbook: Combines all of the latest techniques for the preparation of mineral to biological samples Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level) Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Links to a complementary interactive database website which is available to scientists worldwide* Written by authors with 100 years of combined experience in electron microscopy http://temsamprep.in2p3.fr/ |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Mineralogy. |
|
|---|
| Topical term or geographic name as entry element |
Microscopy. |
|
|---|
| Topical term or geographic name as entry element |
Nanotechnology. |
|
|---|
| Topical term or geographic name as entry element |
Surfaces (Physics). |
|
|---|
| Topical term or geographic name as entry element |
Materials Science. |
|
|---|
| Topical term or geographic name as entry element |
Characterization and Evaluation of Materials. |
|
|---|
| Topical term or geographic name as entry element |
Biological Microscopy. |
|
|---|
| Topical term or geographic name as entry element |
Mineralogy. |
|
|---|
| Topical term or geographic name as entry element |
Nanotechnology. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Beaunier, Luc. |
| Relator term |
author. |
|
|---|
| Personal name |
Boumendil, Jacqueline. |
| Relator term |
author. |
|
|---|
| Personal name |
Ehret, Gabrielle. |
| Relator term |
author. |
|
|---|
| Personal name |
Laub, Danièle. |
| Relator term |
author. |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
|---|
| Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY |
|---|
| Title |
Springer eBooks |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Display text |
Printed edition: |
| International Standard Book Number |
9780387981819 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
http://dx.doi.org/10.1007/978-0-387-98182-6 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
|
| Item type |
E-Book |
