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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces (Record no. 27451)

000 -LEADER
fixed length control field 03177nam a22004815i 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140310153326.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 110406s2011 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781441978172
978-1-4419-7817-2
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TP807-823
Classification number TA418.9.C6
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.14
Edition number 23
264 #1 -
-- New York, NY :
-- Springer New York,
-- 2011.
912 ## -
-- ZDB-2-CMS
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Walkosz, Weronika.
Relator term author.
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE
Title Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
Medium [electronic resource] /
Statement of responsibility, etc by Weronika Walkosz.
300 ## - PHYSICAL DESCRIPTION
Extent XIV, 110 p.
Other physical details online resource.
440 1# - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Springer Theses
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Silicon Nitride Ceramics -- Theoretical Methods and Approximations -- Overview of Experimental Tools -- Structural Energetics of β−Si3N4 (1010) Surfaces -- Atomic Resolution Study of the Interfacial Bonding at SI3N4/CEO2−∂ Grain Boundaries -- Atomic Resolution Study of β−Si3N4/ SIO2 Interfaces -- Imagine Bulk α -SI3N4 -- Conclusions and Future Work -- Appendices -- Cited Literature.
520 ## - SUMMARY, ETC.
Summary, etc This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si3N4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF).  These interfaces are of a great fundamental and technological interest because they play an important role in the microstructural evolution and mechanical properties of Si3N4 ceramics used in many high temperature and pressure applications.  The main contribution of this work is its detailed description of the bonding characteristics of light atoms, in particular oxygen and nitrogen, at these interfaces, which has not been achieved before.  The atomic-scale information on the arrangement of both light and heavy atoms is critical for realistic modeling of interface properties, such as interface strength and ion transport, and will facilitate increased control over the performance of ceramic and semiconductor materials for a wide-range of applications. This Doctoral Thesis has been accepted by the University of Illinois-Chicago, Chicago, USA.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Microreactors.
Topical term or geographic name as entry element Chemistry, Physical organic.
Topical term or geographic name as entry element Materials.
Topical term or geographic name as entry element Materials Science.
Topical term or geographic name as entry element Ceramics, Glass, Composites, Natural Methods.
Topical term or geographic name as entry element Spectroscopy and Microscopy.
Topical term or geographic name as entry element Physical Chemistry.
Topical term or geographic name as entry element Structural Materials.
Topical term or geographic name as entry element Atomic/Molecular Structure and Spectra.
Topical term or geographic name as entry element Microengineering.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9781441978165
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-1-4419-7817-2
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Item type E-Book
Copies
Price effective from Permanent location Date last seen Not for loan Date acquired Source of classification or shelving scheme Koha item type Damaged status Lost status Withdrawn status Current location Full call number
2014-04-14AUM Main Library2014-04-14 2014-04-14 E-Book   AUM Main Library620.14