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| 003 - CONTROL NUMBER IDENTIFIER |
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OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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20140310153326.0 |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
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120301s2012 xxu| s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9781461421917 |
|
978-1-4614-2191-7 |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
|---|
| Classification number |
TA404.6 |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
620.11 |
| Edition number |
23 |
| 264 #1 - |
|---|
| -- |
Boston, MA : |
| -- |
Springer US, |
| -- |
2012. |
| 912 ## - |
|---|
| -- |
ZDB-2-CMS |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Vogt, Thomas. |
| Relator term |
editor. |
| 245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE |
|---|
| Title |
Modeling Nanoscale Imaging in Electron Microscopy |
| Medium |
[electronic resource] / |
| Statement of responsibility, etc |
edited by Thomas Vogt, Wolfgang Dahmen, Peter Binev. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
XV, 265p. 80 illus., 32 illus. in color. |
| Other physical details |
online resource. |
| 440 1# - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
Nanostructure Science and Technology, |
| International Standard Serial Number |
1571-5744 |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Statistical and Information-Theoretic Analysis of Resolution in Imaging -- (Scanning) Transmission Electron Microscopy: Overview and Examples for the Non-Microscopist -- Seeing Atoms in the Crossroads of Microscopy and Mathematics -- Kantianism at the Nanoscale -- Reference free cryo-EM algorithms using self-consistent data fusion -- Reference free cryo-EM algorithms using self-consistent data fusion -- Applications of multivariate statistical analysis for large-scale spectrum-image datasets and atomic-resolution images -- Compressed Sensing -- Imaging the behavior of atoms, clusters and nanoparticles during elevated temperature experiments in an aberration-corrected electron microscope -- Towards Quantitative Imaging using Aberration Correction and Exit Wave Reconstruction -- Image registration, classification and averaging in cryo-electron tomography -- (Scanning) Transmission Electron Microscopy with High spatial, temporal and energy resolution -- Fluctuation Microscopy: Nanoscale Order in Amorphous Materials from Electron Nanodiffraction -- Information in super-resolution microscopy and automated analysis of large-scale calcium imaging data -- Concluding remarks on Imaging in Electron Microscopy. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc |
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Analytical biochemistry. |
|
|---|
| Topical term or geographic name as entry element |
Chemistry. |
|
|---|
| Topical term or geographic name as entry element |
Nanotechnology. |
|
|---|
| Topical term or geographic name as entry element |
Surfaces (Physics). |
|
|---|
| Topical term or geographic name as entry element |
Materials Science. |
|
|---|
| Topical term or geographic name as entry element |
Characterization and Evaluation of Materials. |
|
|---|
| Topical term or geographic name as entry element |
Analytical Chemistry. |
|
|---|
| Topical term or geographic name as entry element |
Nanotechnology. |
|
|---|
| Topical term or geographic name as entry element |
Theoretical and Computational Chemistry. |
|
|---|
| Topical term or geographic name as entry element |
Measurement Science and Instrumentation. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Dahmen, Wolfgang. |
| Relator term |
editor. |
|
|---|
| Personal name |
Binev, Peter. |
| Relator term |
editor. |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
|---|
| Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY |
|---|
| Title |
Springer eBooks |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Display text |
Printed edition: |
| International Standard Book Number |
9781461421900 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
http://dx.doi.org/10.1007/978-1-4614-2191-7 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
|
| Item type |
E-Book |
