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Atom Probe Microscopy (Record no. 27511)

000 -LEADER
fixed length control field 04221nam a22004935i 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140310153326.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 120825s2012 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781461434368
978-1-4614-3436-8
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TA404.6
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.11
Edition number 23
264 #1 -
-- New York, NY :
-- Springer New York :
-- Imprint: Springer,
-- 2012.
912 ## -
-- ZDB-2-CMS
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Gault, Baptiste.
Relator term author.
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE
Title Atom Probe Microscopy
Medium [electronic resource] /
Statement of responsibility, etc by Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer.
300 ## - PHYSICAL DESCRIPTION
Extent XXIII, 396 p. 194 illus., 116 illus. in color.
Other physical details online resource.
440 1# - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Springer Series in Materials Science,
International Standard Serial Number 0933-033X ;
Volume number/sequential designation 160
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Preface -- Acknowledgements -- List of Acronyms and Abbreviations -- List of Terms -- List of Non-SI Units and Constant Values -- PART I Fundamentals -- 1. Introduction -- 2. Field Ion Microscopy -- 3 From Field Desorption Microscopy to Atom Probe Tomography -- Part II Practical aspects -- 4. Specimen Preparation -- 5. Experimental protocols in Field Ion Microscopy -- 6. Experimental protocols -- 7. Tomographic reconstruction -- PART III Applying atom probe techniques for materials science -- 8. Analysis techniques for atom probe tomography -- 9. Atom probe microscopy and materials science -- Appendices.
520 ## - SUMMARY, ETC.
Summary, etc Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. Provides the most practical, up-to-date and critical review of  atom probe microscopy techniques Presents a detailed description of the analysis tools Includes practical examples of how the technique can be used in materials science research Stands as a must-have reference for any user of atom probe microscopy
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanochemistry.
Topical term or geographic name as entry element Nanotechnology.
Topical term or geographic name as entry element Surfaces (Physics).
Topical term or geographic name as entry element Materials Science.
Topical term or geographic name as entry element Characterization and Evaluation of Materials.
Topical term or geographic name as entry element Nanoscale Science and Technology.
Topical term or geographic name as entry element Nanochemistry.
Topical term or geographic name as entry element Spectroscopy and Microscopy.
Topical term or geographic name as entry element Nanotechnology.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Moody, Michael P.
Relator term author.
Personal name Cairney, Julie M.
Relator term author.
Personal name Ringer, Simon P.
Relator term author.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9781461434351
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-1-4614-3436-8
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Item type E-Book
Copies
Price effective from Permanent location Date last seen Not for loan Date acquired Source of classification or shelving scheme Koha item type Damaged status Lost status Withdrawn status Current location Full call number
2014-04-14AUM Main Library2014-04-14 2014-04-14 E-Book   AUM Main Library620.11