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005 - DATE AND TIME OF LATEST TRANSACTION |
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20140310153326.0 |
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fixed length control field |
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120825s2012 xxu| s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9781461434368 |
|
978-1-4614-3436-8 |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
TA404.6 |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
620.11 |
Edition number |
23 |
264 #1 - |
-- |
New York, NY : |
-- |
Springer New York : |
-- |
Imprint: Springer, |
-- |
2012. |
912 ## - |
-- |
ZDB-2-CMS |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Gault, Baptiste. |
Relator term |
author. |
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE |
Title |
Atom Probe Microscopy |
Medium |
[electronic resource] / |
Statement of responsibility, etc |
by Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
XXIII, 396 p. 194 illus., 116 illus. in color. |
Other physical details |
online resource. |
440 1# - SERIES STATEMENT/ADDED ENTRY--TITLE |
Title |
Springer Series in Materials Science, |
International Standard Serial Number |
0933-033X ; |
Volume number/sequential designation |
160 |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Preface -- Acknowledgements -- List of Acronyms and Abbreviations -- List of Terms -- List of Non-SI Units and Constant Values -- PART I Fundamentals -- 1. Introduction -- 2. Field Ion Microscopy -- 3 From Field Desorption Microscopy to Atom Probe Tomography -- Part II Practical aspects -- 4. Specimen Preparation -- 5. Experimental protocols in Field Ion Microscopy -- 6. Experimental protocols -- 7. Tomographic reconstruction -- PART III Applying atom probe techniques for materials science -- 8. Analysis techniques for atom probe tomography -- 9. Atom probe microscopy and materials science -- Appendices. |
520 ## - SUMMARY, ETC. |
Summary, etc |
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. Provides the most practical, up-to-date and critical review of atom probe microscopy techniques Presents a detailed description of the analysis tools Includes practical examples of how the technique can be used in materials science research Stands as a must-have reference for any user of atom probe microscopy |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Nanochemistry. |
|
Topical term or geographic name as entry element |
Nanotechnology. |
|
Topical term or geographic name as entry element |
Surfaces (Physics). |
|
Topical term or geographic name as entry element |
Materials Science. |
|
Topical term or geographic name as entry element |
Characterization and Evaluation of Materials. |
|
Topical term or geographic name as entry element |
Nanoscale Science and Technology. |
|
Topical term or geographic name as entry element |
Nanochemistry. |
|
Topical term or geographic name as entry element |
Spectroscopy and Microscopy. |
|
Topical term or geographic name as entry element |
Nanotechnology. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Moody, Michael P. |
Relator term |
author. |
|
Personal name |
Cairney, Julie M. |
Relator term |
author. |
|
Personal name |
Ringer, Simon P. |
Relator term |
author. |
710 2# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY |
Title |
Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Display text |
Printed edition: |
International Standard Book Number |
9781461434351 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
http://dx.doi.org/10.1007/978-1-4614-3436-8 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
|
Item type |
E-Book |