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FIB Nanostructures (Record no. 27627)

000 -LEADER
fixed length control field 05330nam a22004935i 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140310153328.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 140104s2013 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783319028743
978-3-319-02874-3
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number T174.7
Classification number TA418.9.N35
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.115
Edition number 23
264 #1 -
-- Cham :
-- Springer International Publishing :
-- Imprint: Springer,
-- 2013.
912 ## -
-- ZDB-2-CMS
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Wang, Zhiming M.
Relator term editor.
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE
Title FIB Nanostructures
Medium [electronic resource] /
Statement of responsibility, etc edited by Zhiming M. Wang.
300 ## - PHYSICAL DESCRIPTION
Extent XIII, 530 p. 375 illus., 200 illus. in color.
Other physical details online resource.
440 1# - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Lecture Notes in Nanoscale Science and Technology,
International Standard Serial Number 2195-2159 ;
Volume number/sequential designation 20
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Preface -- Chapter 1: Focused Ion Beam (FIB) technology for micro and nanoscale fabrications -- Chapter 2: Epitaxial ferroelectric nanostructures fabricated by FIB milling -- Chapter 3: Low current focused-ion-beam milling for freestanding nanomaterial characterization -- Chapter 4: Focused ion beam milling of carbon nanotube yarns and Bucky-papers: Correlating their internal structure with their macro-properties -- Chapter 5: Nanoscale electrical contacts grown by Focused-Ion-Beam (FIB) Induced Deposition -- Chapter 6: Metal induced crystallization of focused ion beam induced deposition for functional patterned ultrathin nanocarbon -- Chapter 7: Deterministic Fabrication of Micro- and Nano-Structures by Focused Ion Beam -- Chapter 8: Application of ion beam processes to scanning probe microscopy -- Chapter 9: Fabrication of needle-shaped specimens containing sub-surface nanostructures for Electron Tomography -- Chapter 10: Fabrication technique of deformation carriers (gratings and speckle patterns) with FIB for micro/nano-scale deformation measurement -- Chapter 11: Controlled Quantum Dot Formation on Focused Ion Beam patterned GaAs Substrates -- Chapter 12: Development of Functional Metallic Glassy Materials by FIB and Nano-imprint Technologies -- Chapter 13: Nanostructured Materials Driven by Dielectrophoresis on Nanoelectrods Patterned by Focused Ion Beam -- Chapter 14: Focused Ion Beam Assisted Nano-Scale Processing and Thermoelectrical Characterization -- Chapter 15: FIB design for Nanofluidic applications -- Chapter 16: FIB Patterning of Stainless Steel for the Development of Nano-Structured Stent Surfaces for Cardiovascular Applications -- Chapter 17: Evaluation of damages induced by Ga+ focused ion beam in piezoelectric nanostructures -- Chapter 18: Instabilities in Focused Ion Beam-patterned nanostructures -- Chapter 19: Nanostructures by mass-separated FIB -- Index.
520 ## - SUMMARY, ETC.
Summary, etc FIB Nanostructures reviews a range of methods, including milling, etching, deposition, and implantation, applied to manipulate structures at the nanoscale. Focused Ion Beam (FIB) is an important tool for manipulating the structure of materials at the nanoscale, and substantially extends the range of possible applications of nanofabrication. FIB techniques are widely used in the semiconductor industry and in materials research for deposition and ablation, including the fabrication of nanostructures such as nanowires, nanotubes, nanoneedles, graphene sheets, quantum dots, etc. The main objective of this book is to create a platform for knowledge sharing and dissemination of the latest advances in novel areas of FIB for nanostructures and related materials and devices, and to provide a comprehensive introduction to the field and directions for further research. Chapters written by leading scientists throughout the world create a fundamental bridge between focused ion beam and nanotechnology that is intended to stimulate readers' interest in developing new types of nanostructures for application to semiconductor technology. These applications are increasingly important for the future development of materials science, energy technology, and electronic devices. The book can be recommended for physics, electric engineering, and materials science departments as a reference on materials science and device design. Offers comprehensive coverage of novel nanostructures fabricated by focused ion beam Provides the keys to understanding the emerging area of FIB nanostructures Written by leading experts in each research area Describes a key enabling technology forming a bridge between materials science research and the development of energy-related and other electronic devices
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanochemistry.
Topical term or geographic name as entry element Engineering.
Topical term or geographic name as entry element Optical materials.
Topical term or geographic name as entry element Nanotechnology.
Topical term or geographic name as entry element Materials Science.
Topical term or geographic name as entry element Nanotechnology.
Topical term or geographic name as entry element Semiconductors.
Topical term or geographic name as entry element Nanotechnology and Microengineering.
Topical term or geographic name as entry element Nanochemistry.
Topical term or geographic name as entry element Nanoscale Science and Technology.
Topical term or geographic name as entry element Optical and Electronic Materials.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9783319028736
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-3-319-02874-3
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Item type E-Book
Copies
Price effective from Permanent location Date last seen Not for loan Date acquired Source of classification or shelving scheme Koha item type Damaged status Lost status Withdrawn status Current location Full call number
2014-04-14AUM Main Library2014-04-14 2014-04-14 E-Book   AUM Main Library620.115
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