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Optical Measurement of Surface Topography (Record no. 27692)

000 -LEADER
fixed length control field 02843nam a22004215i 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140310153328.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 110330s2011 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783642120121
978-3-642-12012-1
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TA404.6
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.11
Edition number 23
264 #1 -
-- Berlin, Heidelberg :
-- Springer Berlin Heidelberg,
-- 2011.
912 ## -
-- ZDB-2-CMS
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Leach, Richard.
Relator term editor.
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE
Title Optical Measurement of Surface Topography
Medium [electronic resource] /
Statement of responsibility, etc edited by Richard Leach.
300 ## - PHYSICAL DESCRIPTION
Extent XIV, 326p. 231 illus., 42 illus. in color.
Other physical details online resource.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Introduction to surface texture measurement -- Some common terms and definitions -- Limitations of optical 3D sensors.- Calibration of optical surface topography measuring instruments.- Chromatic confocal microscopy -- Point autofocus instruments.- Focus variation instruments.- Phase shifting interferometry.-  Coherence scanning interferometry -- Digital holographic microscopy.- Imaging confocal microscopy.- Light scattering methods.
520 ## - SUMMARY, ETC.
Summary, etc The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manu­facturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Microwaves.
Topical term or geographic name as entry element Surfaces (Physics).
Topical term or geographic name as entry element Materials Science.
Topical term or geographic name as entry element Characterization and Evaluation of Materials.
Topical term or geographic name as entry element Microwaves, RF and Optical Engineering.
Topical term or geographic name as entry element Measurement Science and Instrumentation.
Topical term or geographic name as entry element Surfaces and Interfaces, Thin Films.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9783642120114
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-3-642-12012-1
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Item type E-Book
Copies
Price effective from Permanent location Date last seen Not for loan Date acquired Source of classification or shelving scheme Koha item type Damaged status Lost status Withdrawn status Current location Full call number
2014-04-14AUM Main Library2014-04-14 2014-04-14 E-Book   AUM Main Library620.11

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