| 000 -LEADER |
|---|
| fixed length control field |
01576cam a22002538a 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20191019115546.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
101102s2010 flu b 001 0 eng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9781439821404 (hardback) |
| 041 ## - Language |
|---|
| Language code of text/sound track or separate title |
eng |
| 050 00 - LIBRARY OF CONGRESS CALL NUMBER |
|---|
| Classification number |
TK7895.E42 |
| Item number |
P738 |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
004.16 |
| Edition number |
22 |
| Item number |
P738 |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Pries, Kim H., |
| Dates associated with a name |
1955- |
| 9 (RLIN) |
4987 |
| 245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE |
|---|
| Title |
Testing complex and embedded systems / |
| Statement of responsibility, etc |
Kim H. Pries, Jon M. Quigley. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication, distribution, etc |
Boca Raton, FL : |
| Name of publisher, distributor, etc |
CRC Press, |
| Date of publication, distribution, etc |
2010. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xvi, 287 p. : |
| Other physical details |
ill. ; |
| Dimensions |
25 cm. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc |
Includes bibliographical references and index. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc |
"Using combinatorial approaches, this book aims to motivate testers and testing organizations to perform meaningful testing. The text details planning activities prior to testing, how to scope the work, and how to achieve a successful conclusion. Rather than presenting the entire continuum of testing for a particular product or design attribute, this volume focuses on boundary conditions. The authors provide various techniques that can be used to streamline testing and help identify problems before they occur, including turbocharge testing methods from Six Sigma. Coverage includes testing, simulation, and emulation"-- |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Embedded computer systems |
| General subdivision |
Testing. |
| 9 (RLIN) |
4335 |
|
|---|
| Topical term or geographic name as entry element |
COMPUTERS / Software Development & Engineering / General |
| Source of heading or term |
bisacsh. |
| 9 (RLIN) |
2697 |
|
|---|
| Topical term or geographic name as entry element |
TECHNOLOGY & ENGINEERING / Electronics / General |
| Source of heading or term |
bisacsh. |
| 9 (RLIN) |
4988 |
|
|---|
| Topical term or geographic name as entry element |
TECHNOLOGY & ENGINEERING / Engineering (General) |
| Source of heading or term |
bisacsh. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Quigley, Jon M. |
| 9 (RLIN) |
4989 |
| Relator term |
joint author |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
|
| Item type |
Book |
