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Efficient Test Methodologies for High-Speed Serial Links

by Hong, Dongwoo.
Authors: Cheng, Kwang-Ting.%author. | SpringerLink (Online service) Series: Lecture Notes in Electrical Engineering, 1876-1100 ; . 51 Physical details: XII, 98p. online resource. ISBN: 9048134439 Subject(s): Engineering. | Computer science. | Systems engineering. | Engineering. | Circuits and Systems. | Register-Transfer-Level Implementation.
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E-Book E-Book AUM Main Library 621.3815 (Browse Shelf) Not for loan

An Efficient Jitter Measurement Technique -- BER Estimation for Linear Clock and Data Recovery Circuit -- BER Estimation for Non-linear Clock and Data Recovery Circuit -- Gaps in Timing Margining Test -- An Accurate Jitter Estimation Technique -- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers -- Conclusions.

With the increasing demand for higher data bandwidth, communication systems’ data rates have reached the multi-gigahertz range and even beyond. Advances in semiconductor technologies have accelerated the adoption of high-speed serial interfaces, such as PCI-Express, Serial-ATA, and XAUI, in order to mitigate the high pin-count and the data-channel skewing problems. However, with the increasing number of I/O pins and greater data rates, significant challenges arise for testing high-speed interfaces in terms of test cost and quality, especially in high volume manufacturing (HVM) environments. Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

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