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Micro- and nanoscale phenomena in tribology /

Authors: Chung, Yip-wah,%1950-%editor Published by : CRC Press, (Boca Raton, FL :) Physical details: xxii, 210 p. : ill. ; 25 cm. ISBN: 1439839220 Subject(s): Tribology. | Nanotechnology. Year: 2012
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Item type Location Call Number Status Notes Date Due
Book Book AUM Main Library 621.89 M524 (Browse Shelf) Available JBC/2011/16930
Book Book AUM Main Library 621.89 M524 (Browse Shelf) Available JBC/2011/16930

Includes bibliographical references and index.

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