Library of American University of Madaba Search for 'su:Quality Control, Reliability, Safety and Risk. and se:SpringerBriefs in Applied Sciences and Technology, and su-to:Quality Control, Reliability, Safety and Risk.'

Electromigration Modeling at Circuit Layout Level

By Tan, Cher Ming.. . IX, 103 p. 75 illus., 2 illus. in color. 9789814451215

By Amalberti, René.. . XV, 132 p. 7 illus., 6 illus. in color. 9789400765498

By Caron, Franco.. . VIII, 88 p. 13 illus. 9788847052444