|
|
Practical high-performance liquid chromatography /
by Meyer, Veronika.
Publication:
Chichester, England : Wiley, 2010
. xiii, 412 p. :
24 cm.
Date:2010
Availability:
Copies available:
AUM Main Library
(2),
|
|
|
White space revisited : , creating value through process /
by Rummler, Geary A.
Publication:
San Francisco, CA : Jossey-Bass, 2010
. xxiii, 251 p. :
26 cm.
Date:2010
Availability:
Copies available:
AUM Main Library
(2),
|
|
|
Advanced charaterisation of pavement and soil engineering materials : , proceeding of the international conference on advanced characterisation of pavement and soil engineering materials, 20-22 June 2007, Athens, Greece /
Publication:
London : Taylor and Francis, 2007
. 2 vol. :
Date:2007
Availability:
Copies available:
AUM Main Library
(4),
|
|
|
From scientific instrument to industrial machine
by Doornbos, Richard.
Publication:
. XII, 112p. 55 illus.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
VLSI 2010 Annual Symposium
by Voros, Nikolaos.
Publication:
. X, 346 p.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
Design, Analysis and Test of Logic Circuits Under Uncertainty
by Krishnaswamy, Smita.
Publication:
. XI, 123 p. 71 illus.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
by Fan, Yongquan.
Publication:
. XII, 250p. 120 illus., 60 illus. in color.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
Models in Hardware Testing
by Wunderlich, Hans-Joachim.
Publication:
. XIV, 257 p.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
Trustworthy Internet
by Salgarelli, Luca.
Publication:
. XVIII, 369p. 84 illus.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
LTE-Advanced Relay Technology and Standardization
by Yuan, Yifei.
Publication:
. XV, 186 p. 133 illus., 70 illus. in color.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
Fault-Tolerant Design
by Dubrova, Elena.
Publication:
. XV, 185 p. 84 illus.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
Predictive Technology Model for Robust Nanoelectronic Design
by Cao, Yu.
Publication:
. XV, 173 p.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
Emerging Technological Risk
by Anderson, Stuart.
Publication:
. XXVI, 186 p.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
Test and Diagnosis for Small-Delay Defects
by Tehranipoor, Mohammad.
Publication:
. XVI, 212p. 114 illus.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
Soft Errors in Modern Electronic Systems
by Nicolaidis, Michael.
Publication:
. XVIII, 318 p.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
Dependability of Networked Computer-based Systems
by Verma, Ajit Kumar.
Publication:
. XVIII, 202 p.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
Software Reliability Assessment with OR Applications
by Kapur, P.K.
Publication:
. XXIV, 548 p.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
Model-Driven Engineering Languages and Systems
by Moreira, Ana.
Publication:
. XXVIII, 792 p. 299 illus.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
Computer Performance Engineering
by Balsamo, Maria Simonetta.
Publication:
. XII, 351 p. 114 illus.
Availability:
Copies available:
AUM Main Library
(1),
|
|
|
OpenMP in the Era of Low Power Devices and Accelerators
by Rendell, Alistair P.
Publication:
. X, 201 p. 80 illus.
Availability:
Copies available:
AUM Main Library
(1),
|
|