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Third International Conference on Advances in Pattern Recognition , ICAPR 2005, Bath, UK, August 22-25, 2005 : proceedings /   Publication: Berlin ; | New York : Springer, 2005 . 2 v. : 24 cm. Date:2005 Availability: No items available:
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Progress in pattern recognition, image analysis and applications : , 10th Iberoamerican Congress on Pattern Recognition, CIARP 2005, Havana, Cuba, November 15-18, 2005 : proceedings /   Publication: New York : Springer, 2005 . xx, 1094 p. : 24 cm. Date:2005 Availability: Copies available: AUM Main Library (3),
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Energy minimization methods in computer vision and pattern recognition : , 5th International Workshop, EMMCVPR 2005, St. Augustine, FL, USA, November 9-11, 2005 : proceedings /   Publication: Berlin : Springer, 2005 . xii, 666 p. : 24 cm. Date:2005 Availability: Copies available: AUM Main Library (3),
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Computer analysis of images and patterns : , 11th international conference, CAIP 2005, Versailles, France, September 5-8, 2005 : proceedings /   Publication: Berlin : Springer, 2005 . xix, 865 p. : 24 cm. Date:2005 Availability: Copies available: AUM Main Library (3),
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Audio- and video-based biometric person authentication : , 5th International Conference, AVBPA 2005, Hilton Rye Town, NY, USA, July 20-22, 2005 : proceedings /   Publication: Berlin : Springer, 2005 . xx, 1134 p. : 24 cm. Date:2005 Availability: Copies available: AUM Main Library (3),
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Computing attitude and affect in text : , theory and applications /   Publication: Dordrecht : Springer, 2006 . xvi, 341 p. : 25 cm. Date:2006 Availability: Copies available: AUM Main Library (2),
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Progress in pattern recognition, speech and image analysis : , 8th Iberoamerican Congress on pattern recognition, CIARP 2003, Havana, Cuba, November 26-29, 2003 : proceedings /   Publication: Berlin : Springer, 2003 . xvii, 693 p. : 24 cm. Date:2003 Availability: Copies available: AUM Main Library (1),
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Perceptual digital imaging , methods and applications /   Publication: Boca Raton, FL : CRC Press, 2017 . xviii, 512 p. : Date:2017 Availability: Copies available: AUM Main Library (1),
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