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Stochastic Cooling of Particle Beams by Möhl, Dieter. Publication: . X, 139 p. 65 illus., 16 illus. in color. Availability: Copies available: AUM Main Library (1),
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Introduction to Polarization Physics by Nurushev, Sandibek B. Publication: . XVIII, 430 p. 112 illus. Availability: Copies available: AUM Main Library (1),
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Nuclear Physics with Polarized Particles by Paetz gen. Schieck, Hans. Publication: . XV, 182p. 68 illus. Availability: Copies available: AUM Main Library (1),
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Nondestructive Testing of Materials and Structures by Büyüköztürk, Oral. Publication: . XXIX, 1278 p. 776 illus., 370 illus. in color. Availability: Copies available: AUM Main Library (1),
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Ellipsometry at the Nanoscale by Losurdo, Maria. Publication: . XXIV, 730 p. 423 illus., 106 illus. in color. Availability: Copies available: AUM Main Library (1),
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Fundamentals of Mass Determination by Borys, Michael. Publication: . IX, 114p. Availability: Copies available: AUM Main Library (1),
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Optical Measurements, Modeling, and Metrology, Volume 5 by Proulx, Tom. Publication: . X, 422 p. Availability: Copies available: AUM Main Library (1),
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Thermomechanics and Infra-Red Imaging, Volume 7 by Proulx, Tom. Publication: . VIII, 132 p. Availability: Copies available: AUM Main Library (1),
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Nanoindentation by Fischer-Cripps, Anthony C. Publication: . XXII, 282 p. Availability: Copies available: AUM Main Library (1),
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Interventional Magnetic Resonance Imaging by Kahn, Thomas. Publication: . XVIII, 489 p. 450 illus., 150 illus. in color. Availability: Copies available: AUM Main Library (1),
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Atmospheric Effects in Space Geodesy by Böhm, Johannes. Publication: . XVII, 234 p. 76 illus., 53 illus. in color. Availability: Copies available: AUM Main Library (1),
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The Dawn Mission to Minor Planets 4 Vesta and 1 Ceres by Russell, Christopher. Publication: . VI, 574 p. 308 illus., 211 illus. in color. Availability: Copies available: AUM Main Library (1),
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Surface Science Techniques by Bracco, Gianangelo. Publication: . XXIII, 663 p. 327 illus., 155 illus. in color. Availability: Copies available: AUM Main Library (1),
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Springer Handbook of Metrology and Testing by Czichos, Horst. Publication: . 1500p. 500 illus. in color. Availability: Copies available: AUM Main Library (1),
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Optical Measurement of Surface Topography by Leach, Richard. Publication: . XIV, 326p. 231 illus., 42 illus. in color. Availability: Copies available: AUM Main Library (1),
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New Horizons of Applied Scanning Electron Microscopy by Shimizu, Kenichi. Publication: . XIV, 182p. 102 illus., 25 illus. in color. Availability: Copies available: AUM Main Library (1),
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Electroanalytical Methods by Scholz, Fritz. Publication: . XXVII, 359p. 101 illus. Availability: Copies available: AUM Main Library (1),
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Ion Beams in Nanoscience and Technology by Hellborg, Ragnar. Publication: . xxiii, 457 p Availability: Copies available: AUM Main Library (1),
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Modeling Nanoscale Imaging in Electron Microscopy by Vogt, Thomas. Publication: . XV, 265p. 80 illus., 32 illus. in color. Availability: Copies available: AUM Main Library (1),
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Photo-Excited Charge Collection Spectroscopy by Im, Seongil. Publication: . XI, 101 p. 61 illus. Availability: Copies available: AUM Main Library (1),
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