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NMR Methods for the Investigation of Structure and Transport
by Hardy, Edme H.
Publication:
. XVIII, 210 p.
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Raman Spectroscopy for Nanomaterials Characterization
by Kumar, Challa S. S. R.
Publication:
. XII, 646p. 313 illus.
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How Do Spores Select Where to Settle?
by Heydt, Matthias.
Publication:
. XVIII, 178p. 121 illus., 44 illus. in color.
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High Resolution Microbial Single Cell Analytics
by Müller, Susann.
Publication:
. XIV, 234 p.
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X-Ray Diffraction Crystallography
by Waseda, Yoshio.
Publication:
. XI, 310p. 150 illus.
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Coherent Light Microscopy
by Ferraro, Pietro.
Publication:
. XVI, 372 p.
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Optical Generation and Control of Quantum Coherence in Semiconductor Nanostructures
by Slavcheva, Gabriela.
Publication:
. XX, 338p. 150 illus., 5 illus. in color.
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Theory of Semiconductor Quantum Devices
by Rossi, Fausto.
Publication:
. XIV, 382 p.
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Organic Electronics
by Grasser, Tibor.
Publication:
. XIV, 328p.
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New Horizons of Applied Scanning Electron Microscopy
by Shimizu, Kenichi.
Publication:
. XIV, 182p. 102 illus., 25 illus. in color.
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Semi-solid Processing of Alloys
by Kirkwood, David H.
Publication:
. XII, 172 p. 103 illus.
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Ion Beams in Nanoscience and Technology
by Hellborg, Ragnar.
Publication:
. xxiii, 457 p
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Laser Photodissociation and Spectroscopy of Mass-separated Biomolecular Ions
by Polfer, Nicolas C.
Publication:
. XI, 119 p. 79 illus., 36 illus. in color.
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Local Electrode Atom Probe Tomography
by Larson, David J.
Publication:
. XVII, 318 p. 164 illus., 54 illus. in color.
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Helium Ion Microscopy
by Joy, David C.
Publication:
. VIII, 64 p. 29 illus., 16 illus. in color.
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Atom Probe Microscopy
by Gault, Baptiste.
Publication:
. XXIII, 396 p. 194 illus., 116 illus. in color.
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Photoelectrochemical Hydrogen Production
by van de Krol, Roel.
Publication:
. VIII, 324 p.
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Electron Energy-Loss Spectroscopy in the Electron Microscope
by Egerton, R.F.
Publication:
. XII, 491p. 215 illus., 26 illus. in color.
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Pharmaceutical Microscopy
by Carlton, Robert Allen.
Publication:
. XIV, 321p. 139 illus., 102 illus. in color.
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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
by Walkosz, Weronika.
Publication:
. XIV, 110 p.
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