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Practical high-performance liquid chromatography / by Meyer, Veronika. Publication: Chichester, England : Wiley, 2010 . xiii, 412 p. : 24 cm. Date:2010 Availability: Copies available: AUM Main Library (2),
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White space revisited : , creating value through process / by Rummler, Geary A. Publication: San Francisco, CA : Jossey-Bass, 2010 . xxiii, 251 p. : 26 cm. Date:2010 Availability: Copies available: AUM Main Library (2),
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Advanced charaterisation of pavement and soil engineering materials : , proceeding of the international conference on advanced characterisation of pavement and soil engineering materials, 20-22 June 2007, Athens, Greece /   Publication: London : Taylor and Francis, 2007 . 2 vol. : Date:2007 Availability: Copies available: AUM Main Library (4),
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From scientific instrument to industrial machine by Doornbos, Richard. Publication: . XII, 112p. 55 illus. Availability: Copies available: AUM Main Library (1),
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VLSI 2010 Annual Symposium by Voros, Nikolaos. Publication: . X, 346 p. Availability: Copies available: AUM Main Library (1),
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Design, Analysis and Test of Logic Circuits Under Uncertainty by Krishnaswamy, Smita. Publication: . XI, 123 p. 71 illus. Availability: Copies available: AUM Main Library (1),
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Accelerating Test, Validation and Debug of High Speed Serial Interfaces by Fan, Yongquan. Publication: . XII, 250p. 120 illus., 60 illus. in color. Availability: Copies available: AUM Main Library (1),
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Models in Hardware Testing by Wunderlich, Hans-Joachim. Publication: . XIV, 257 p. Availability: Copies available: AUM Main Library (1),
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Trustworthy Internet by Salgarelli, Luca. Publication: . XVIII, 369p. 84 illus. Availability: Copies available: AUM Main Library (1),
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LTE-Advanced Relay Technology and Standardization by Yuan, Yifei. Publication: . XV, 186 p. 133 illus., 70 illus. in color. Availability: Copies available: AUM Main Library (1),
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Fault-Tolerant Design by Dubrova, Elena. Publication: . XV, 185 p. 84 illus. Availability: Copies available: AUM Main Library (1),
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Predictive Technology Model for Robust Nanoelectronic Design by Cao, Yu. Publication: . XV, 173 p. Availability: Copies available: AUM Main Library (1),
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Emerging Technological Risk by Anderson, Stuart. Publication: . XXVI, 186 p. Availability: Copies available: AUM Main Library (1),
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Test and Diagnosis for Small-Delay Defects by Tehranipoor, Mohammad. Publication: . XVI, 212p. 114 illus. Availability: Copies available: AUM Main Library (1),
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Soft Errors in Modern Electronic Systems by Nicolaidis, Michael. Publication: . XVIII, 318 p. Availability: Copies available: AUM Main Library (1),
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Dependability of Networked Computer-based Systems by Verma, Ajit Kumar. Publication: . XVIII, 202 p. Availability: Copies available: AUM Main Library (1),
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Software Reliability Assessment with OR Applications by Kapur, P.K. Publication: . XXIV, 548 p. Availability: Copies available: AUM Main Library (1),
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Model-Driven Engineering Languages and Systems by Moreira, Ana. Publication: . XXVIII, 792 p. 299 illus. Availability: Copies available: AUM Main Library (1),
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Computer Performance Engineering by Balsamo, Maria Simonetta. Publication: . XII, 351 p. 114 illus. Availability: Copies available: AUM Main Library (1),
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OpenMP in the Era of Low Power Devices and Accelerators by Rendell, Alistair P. Publication: . X, 201 p. 80 illus. Availability: Copies available: AUM Main Library (1),
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