Library of American University of Madaba
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Terrestrial neutron-induced soft errors in advanced memory devices /
Takashi Nakamura ... [et al.].
- Hackensack, NJ : World Scientific, 2008.
- xxii, 343 p. : ill. (some col.) ; 24 cm.
Includes bibliographical references (p. 291-315) and index.
Introduction -- Terrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges.
9789812778819 9812778810
Semiconductor storage devices.
Neutron irradiation.
Radiation dosimetry.
Nuclear physics
TK7895.M4 / T455
621.39732 / T455
Includes bibliographical references (p. 291-315) and index.
Introduction -- Terrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges.
9789812778819 9812778810
Semiconductor storage devices.
Neutron irradiation.
Radiation dosimetry.
Nuclear physics
TK7895.M4 / T455
621.39732 / T455