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Terrestrial neutron-induced soft errors in advanced memory devices /

Authors: Nakamura, Takashi,%1939- Published by : World Scientific, (Hackensack, NJ :) Physical details: xxii, 343 p. : ill. (some col.) ; 24 cm. ISBN: 9812778810 Subject(s): Semiconductor storage devices. | Neutron irradiation. | Radiation dosimetry. | Nuclear physics Year: 2008
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Book Book AUM Main Library 621.39732 T455 (Browse Shelf) Available

Includes bibliographical references (p. 291-315) and index.

Introduction -- Terrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges.

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