Micro- and nanoscale phenomena in tribology /
editor, Yip-Wah Chung.
- Boca Raton, FL : CRC Press, 2012.
- xxii, 210 p. : ill. ; 25 cm.
Includes bibliographical references and index.
9781439839225 (hardcover : alk. paper)
Tribology.
Nanotechnology.
TJ1075 / M524
621.89 / M524