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Efficient Test Methodologies for High-Speed Serial Links (Record no. 12445)

000 -LEADER
fixed length control field 02844nam a22004215i 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140310143357.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100301s2010 ne | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789048134434
978-90-481-3443-4
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition number 23
264 #1 -
-- Dordrecht :
-- Springer Netherlands,
-- 2010.
912 ## -
-- ZDB-2-ENG
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Hong, Dongwoo.
Relator term author.
245 10 - IMMEDIATE SOURCE OF ACQUISITION NOTE
Title Efficient Test Methodologies for High-Speed Serial Links
Medium [electronic resource] /
Statement of responsibility, etc by Dongwoo Hong, Kwang-Ting Cheng.
300 ## - PHYSICAL DESCRIPTION
Extent XII, 98p.
Other physical details online resource.
440 1# - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Lecture Notes in Electrical Engineering,
International Standard Serial Number 1876-1100 ;
Volume number/sequential designation 51
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note An Efficient Jitter Measurement Technique -- BER Estimation for Linear Clock and Data Recovery Circuit -- BER Estimation for Non-linear Clock and Data Recovery Circuit -- Gaps in Timing Margining Test -- An Accurate Jitter Estimation Technique -- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers -- Conclusions.
520 ## - SUMMARY, ETC.
Summary, etc With the increasing demand for higher data bandwidth, communication systems’ data rates have reached the multi-gigahertz range and even beyond. Advances in semiconductor technologies have accelerated the adoption of high-speed serial interfaces, such as PCI-Express, Serial-ATA, and XAUI, in order to mitigate the high pin-count and the data-channel skewing problems. However, with the increasing number of I/O pins and greater data rates, significant challenges arise for testing high-speed interfaces in terms of test cost and quality, especially in high volume manufacturing (HVM) environments. Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
Topical term or geographic name as entry element Computer science.
Topical term or geographic name as entry element Systems engineering.
Topical term or geographic name as entry element Engineering.
Topical term or geographic name as entry element Circuits and Systems.
Topical term or geographic name as entry element Register-Transfer-Level Implementation.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Cheng, Kwang-Ting.
Relator term author.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9789048134427
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-90-481-3443-4
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Item type E-Book
Copies
Price effective from Permanent location Date last seen Not for loan Date acquired Source of classification or shelving scheme Koha item type Damaged status Lost status Withdrawn status Current location Full call number
2014-04-03AUM Main Library2014-04-03 2014-04-03 E-Book   AUM Main Library621.3815

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