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Library of American University of Madaba
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Advanced Test Methods for SRAMs
by
Bosio, Alberto.
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Power-Aware Testing and Test Strategies for Low Power Devices
by
Girard, Patrick.
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. XXII, 353p. 444 illus., 222 illus. in color.
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Dynamic Formal Epistemology
by
Girard, Patrick.
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. X, 242 p.
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Authors
Girard, Patrick.
Marion, Mathieu.
Nicolici, Nicola.
Pravossoudovitch, Se...
Wen, Xiaoqing.
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Synthese Library, St...
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