//]]>
Advanced Test Methods for SRAMs by Bosio, Alberto. Publication: Availability: Copies available: AUM Main Library (1),
Actions: Add to Cart
Power-Aware Testing and Test Strategies for Low Power Devices by Girard, Patrick. Publication: . XXII, 353p. 444 illus., 222 illus. in color. Availability: Copies available: AUM Main Library (1),
Actions: Add to Cart
Dynamic Formal Epistemology by Girard, Patrick. Publication: . X, 242 p. Availability: Copies available: AUM Main Library (1),
Actions: Add to Cart