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Advanced Test Methods for SRAMs
by
Bosio, Alberto.
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Power-Aware Testing and Test Strategies for Low Power Devices
by
Girard, Patrick.
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. XXII, 353p. 444 illus., 222 illus. in color.
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Dynamic Formal Epistemology
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Girard, Patrick.
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. X, 242 p.
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Girard, Patrick.
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