Multi-probe UHV machine instrumentation -- Nano-material nanowires charaterisation -- Surface conductance measurements -- Surface atomic scale machineries (transistor, logic gate, mechanics) -- Industrial applications.

This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, span topics such as: multi-probe UHV instrumentation, atomic scale nano-material nanowires characterization, atomic scale surface conductance measurements and surface atomic scale mechanical machineries. This state-of-the-art account allows academic researchers and industry engineers access to the tools they need to be at the forefront of the atomic scale technology revolution.